The effect of particle irradiation on high-resistivity silicon detectors has been extensively studied with the goal of engineering devices able to survive the very challenging radiation environment at the CERN Large Hadron Collider (LHC). The main aspect under investigation has been the changes observed in detector effective doping concentration (N-eff). We have previously proposed a mechanism to explain the evolution of N-eff whereby charge is exchanged directly between closely-spaced defect centres in the dense terminal clusters formed by hadron irradiation. This model has been implemented in both a commercial finite-element device simulator (ISE-TCAD) and 6 purpose-built simulation of inter-defect charge exchange. To control the risk of breakdown due to the high leakage currents foreseen during 10 years of LHC operation, silicon detectors will be operated below room temperature (around -10degreesC). This, and more general current interest in the field of cryogenic operation, has led us to investigate the behaviour of our model over a wide range of temperatures. We present charge collection spectra from 1064nm laser pulses as a function of detector bias between temperatures of 115K and 290K using devices irradiated with 23 GeV proton fluences in the range 10(13) - 4x10(14) cm(-2). These data allow a deeper investigation of the influence of defect capture cross-sections on N-eff. The model prediction for the reversion to n-type of heavily-irradiated detectors at low temperature is investigated and deviations from the model explored.
A comprehensive analysis of irradiated silicon detectors at cryogenic temperatures
SANTOCCHIA, Attilio
2003
Abstract
The effect of particle irradiation on high-resistivity silicon detectors has been extensively studied with the goal of engineering devices able to survive the very challenging radiation environment at the CERN Large Hadron Collider (LHC). The main aspect under investigation has been the changes observed in detector effective doping concentration (N-eff). We have previously proposed a mechanism to explain the evolution of N-eff whereby charge is exchanged directly between closely-spaced defect centres in the dense terminal clusters formed by hadron irradiation. This model has been implemented in both a commercial finite-element device simulator (ISE-TCAD) and 6 purpose-built simulation of inter-defect charge exchange. To control the risk of breakdown due to the high leakage currents foreseen during 10 years of LHC operation, silicon detectors will be operated below room temperature (around -10degreesC). This, and more general current interest in the field of cryogenic operation, has led us to investigate the behaviour of our model over a wide range of temperatures. We present charge collection spectra from 1064nm laser pulses as a function of detector bias between temperatures of 115K and 290K using devices irradiated with 23 GeV proton fluences in the range 10(13) - 4x10(14) cm(-2). These data allow a deeper investigation of the influence of defect capture cross-sections on N-eff. The model prediction for the reversion to n-type of heavily-irradiated detectors at low temperature is investigated and deviations from the model explored.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
