Efficient Full-Wave Automated Design and Yield Analysis of Waveguide Components

Automated circuit design of microwave networks relies on using efficient CAD tools: for waveguide technology, modal analysis has emerged as the most useful electromagnetic simulator, either in the generalized scattering matrix (GSM) formulation or in the generalized admittance matrix (GAM) form. It is demonstrated that, when considering the solution of an entire waveguide component, the GAM approach requires half of the unknowns at the internal ports than the GSM representation, hence allowing considerable gain in efficiency. Process-oriented yield analysis of microwave components is generally effected by considering a large number of statistically generated geometrical dimensions and by performing a complete full-wave analysis for each set of dimensions. It is shown that, by using the adjoint network method, it is possible to perform a yield analysis with just one complete analysis of the entire component, hence considerably reducing the numerical effort of yield analysis.