We present the first full experimental characterization of a single-qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n-qubits processing device.

Pauli tomography: complete characterization of a single qubit device

RICCI, MARCO;
2003

Abstract

We present the first full experimental characterization of a single-qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n-qubits processing device.
2003
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11391/125098
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