An improvement of a method for permittivity measurement is introduced based on a dual-band four port planar structure, consisting of two cascaded cross-coupled quadrature hybrids connected through two transmission lines. The applicability of the method to permittivity measurement of thin dielectrics is then demonstrated: permittivity are evaluated at two different frequencies f0 and n*f 0 (n=1,2,3..) by simply detecting the two output amplitudes, thus avoiding any phase measurement and allowing a remarkable space reduction. A prototype has been fabricated in microstrip technology and experimentally tested exhibiting very good accuracy for permittivity measurement at two different frequencies spaced by an octave band

Dual-Band Permittivity Measurement of Thin Dielectric Layers with a Simple Planar Device

OCERA, ALESSANDRO;DIONIGI, Marco;FRATTICCIOLI, ELISA;SORRENTINO, Roberto
2006

Abstract

An improvement of a method for permittivity measurement is introduced based on a dual-band four port planar structure, consisting of two cascaded cross-coupled quadrature hybrids connected through two transmission lines. The applicability of the method to permittivity measurement of thin dielectrics is then demonstrated: permittivity are evaluated at two different frequencies f0 and n*f 0 (n=1,2,3..) by simply detecting the two output amplitudes, thus avoiding any phase measurement and allowing a remarkable space reduction. A prototype has been fabricated in microstrip technology and experimentally tested exhibiting very good accuracy for permittivity measurement at two different frequencies spaced by an octave band
2006
9780780395411
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11391/137564
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