An improvement of a method for permittivity measurement is introduced based on a dual-band four port planar structure, consisting of two cascaded cross-coupled quadrature hybrids connected through two transmission lines. The applicability of the method to permittivity measurement of thin dielectrics is then demonstrated: permittivity are evaluated at two different frequencies f0 and n*f 0 (n=1,2,3..) by simply detecting the two output amplitudes, thus avoiding any phase measurement and allowing a remarkable space reduction. A prototype has been fabricated in microstrip technology and experimentally tested exhibiting very good accuracy for permittivity measurement at two different frequencies spaced by an octave band
Dual-Band Permittivity Measurement of Thin Dielectric Layers with a Simple Planar Device
OCERA, ALESSANDRO;DIONIGI, Marco;FRATTICCIOLI, ELISA;SORRENTINO, Roberto
2006
Abstract
An improvement of a method for permittivity measurement is introduced based on a dual-band four port planar structure, consisting of two cascaded cross-coupled quadrature hybrids connected through two transmission lines. The applicability of the method to permittivity measurement of thin dielectrics is then demonstrated: permittivity are evaluated at two different frequencies f0 and n*f 0 (n=1,2,3..) by simply detecting the two output amplitudes, thus avoiding any phase measurement and allowing a remarkable space reduction. A prototype has been fabricated in microstrip technology and experimentally tested exhibiting very good accuracy for permittivity measurement at two different frequencies spaced by an octave bandI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.