This work describes a wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) developed in our laboratory. The system is an STM-assisted, apertureless microscope featuring nanometric resolution. The system does not exploits resonators -even though parasitic resonances do exist anyway indeed- and records directly the reflection coefficient by means of a 67 GHz VNA. The resolution is improved by a method of tip etching, while the consequent reduced sensitivity is compensated by a post-processing algorithm
A Broad-Band Microwave Scanning Probe Microscope
Venanzoni, Giuseppe;
2011
Abstract
This work describes a wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) developed in our laboratory. The system is an STM-assisted, apertureless microscope featuring nanometric resolution. The system does not exploits resonators -even though parasitic resonances do exist anyway indeed- and records directly the reflection coefficient by means of a 67 GHz VNA. The resolution is improved by a method of tip etching, while the consequent reduced sensitivity is compensated by a post-processing algorithmFile in questo prodotto:
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