The suitability of standard CMOS technology featuring no epitaxial layer for particle detection has been investigated through extensive experimental characterization. Different pixel layout and read-out schemes have been devised and implemented, as well as different test strategies. In this work test results are reported concerning the response of the detector to IR laser, beta-particles and X-rays stimuli, thus confirming the suitability of the proposed approach for high energy physics applications.

Radiation Detectors for HEP Applications Using Standard CMOS Technology

PASSERI, Daniele;PLACIDI, Pisana;
2006

Abstract

The suitability of standard CMOS technology featuring no epitaxial layer for particle detection has been investigated through extensive experimental characterization. Different pixel layout and read-out schemes have been devised and implemented, as well as different test strategies. In this work test results are reported concerning the response of the detector to IR laser, beta-particles and X-rays stimuli, thus confirming the suitability of the proposed approach for high energy physics applications.
2006
9781424405602
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11391/155405
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