A systematic discussion of the main strategies available to improve the performance of silicon integrated inductors is carried out, relying on on-chip measurement related to a specific CMOS technology. Then, a "full-wave" electromagnetic simulator has been customized and validated for the accurate characterization of devices of interest. Finally, such a capability has been applied to extend the discussion to a different foundry process.

Systematic Experimental and Numerical Characterization of Integrated Spiral Inductors in Silicon RF ICs

PALAZZARI, VALERIA;PLACIDI, Pisana;STOPPONI, Giovanni;ALIMENTI, Federico;SCORZONI, Andrea;ROSELLI, Luca
2002

Abstract

A systematic discussion of the main strategies available to improve the performance of silicon integrated inductors is carried out, relying on on-chip measurement related to a specific CMOS technology. Then, a "full-wave" electromagnetic simulator has been customized and validated for the accurate characterization of devices of interest. Finally, such a capability has been applied to extend the discussion to a different foundry process.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11391/157906
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