This paper proposes an accurate analysis of Microelectromechnanical (MEM) switches using the Lumped Element-Finite Difference Time Domain (LE-FDTD) method enriched of the Short-Open Calibration (SOC) technique. The application of this method allows the electrical behavior of MEM switches to be accurately predicted while reducing the computational CPU time.
Short-Open Calibration Technique for Accurate LE-FDTD Simulation of MEM Switches
ALIMENTI, Federico;MEZZANOTTE, Paolo;ROSELLI, Luca
2002
Abstract
This paper proposes an accurate analysis of Microelectromechnanical (MEM) switches using the Lumped Element-Finite Difference Time Domain (LE-FDTD) method enriched of the Short-Open Calibration (SOC) technique. The application of this method allows the electrical behavior of MEM switches to be accurately predicted while reducing the computational CPU time.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.