Net-charge analysis, involving siladamantane moieties as local models of various surface silicon atoms, is used in combination with infrared spectroscopy to assign chemical species to the features observed in the x-ray photoelectron spectra from hydrogen-terminated (1 0 0) Si prepared by HFaq etching of the native oxide.
Counterintuitive assignment of the lines observed by x-ray photoelectron spectroscopy at the hydrogen-terminated (100) surface of silicon
GIORGI, Giacomo;BELANZONI, Paola
2009
Abstract
Net-charge analysis, involving siladamantane moieties as local models of various surface silicon atoms, is used in combination with infrared spectroscopy to assign chemical species to the features observed in the x-ray photoelectron spectra from hydrogen-terminated (1 0 0) Si prepared by HFaq etching of the native oxide.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
