Heterojunction diodes fabricated by plasma enhanced chemical vapor deposition of hydrogenated amorphous carbon (a-C:H) and fluorine doped amorphous carbons (a-C:H:F) on p-type silicon are analyzed in terms of their electronic and photovoltaic properties. Their structural and optical properties were identified by Raman spectroscopy, x-ray photoelectron spectroscopy, ellipsometry, and UV–VIS trasmittance. The nature of the heterojunction is confirmed by the rectifying current– voltage characteristic of the carbonaceous deposits/p-Si junction. The diodes show a behavior dependent on the amount of the fluorine content. The photovoltaic behavior of the junction is investigated as a function of both fluorine incorporation and thermal treatment of the a-C:H:F films after the deposition. Better photovoltaic effects were observed from annealed a-C:H:F heterojunction structures. The optical and structural characterization performed on films after the thermal treatment indicates that this behavior is most likely due to an extended graphitization.

Fluorinated amorphous carbon films prepared by plasma enhanced chemical vapor deposition for solar cell applications

VALENTINI, LUCA;KENNY, Jose Maria;
2003

Abstract

Heterojunction diodes fabricated by plasma enhanced chemical vapor deposition of hydrogenated amorphous carbon (a-C:H) and fluorine doped amorphous carbons (a-C:H:F) on p-type silicon are analyzed in terms of their electronic and photovoltaic properties. Their structural and optical properties were identified by Raman spectroscopy, x-ray photoelectron spectroscopy, ellipsometry, and UV–VIS trasmittance. The nature of the heterojunction is confirmed by the rectifying current– voltage characteristic of the carbonaceous deposits/p-Si junction. The diodes show a behavior dependent on the amount of the fluorine content. The photovoltaic behavior of the junction is investigated as a function of both fluorine incorporation and thermal treatment of the a-C:H:F films after the deposition. Better photovoltaic effects were observed from annealed a-C:H:F heterojunction structures. The optical and structural characterization performed on films after the thermal treatment indicates that this behavior is most likely due to an extended graphitization.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11391/162434
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