A system allowing for deep investigation of charge collection properties of active pixel particle detectors fabricated in standard 0.18μm CMOS bulk technology (i.e. without epitaxial layer) has been devised and implemented. The system includes an advanced laser test bench featuring fast laser pulser (68ps, 80MHz) and different laser heads (UV 407nm, VIS 783nm, IR 1060nm), as well as integrated movement and acquisition capabilities. In particular, the sub-micron focusing and positioning capabilities of the whole system enable efficient, fast and versatile sensor characterization. Extensive test have been carried out, with the aim of evaluating the sensitivity, the spatial resolution and the efficiency of APS CMOS sensors with different wavelength laser stimuli. The test system provides advanced capabilities for deep understanding of silicon particle detectors to be used in High Energy Physics experiments and/or medical imaging systems.
CMOS APS sensor characterization with infrared, visible and ultraviolet laser sources
PASSERI, Daniele;PLACIDI, Pisana;
2007
Abstract
A system allowing for deep investigation of charge collection properties of active pixel particle detectors fabricated in standard 0.18μm CMOS bulk technology (i.e. without epitaxial layer) has been devised and implemented. The system includes an advanced laser test bench featuring fast laser pulser (68ps, 80MHz) and different laser heads (UV 407nm, VIS 783nm, IR 1060nm), as well as integrated movement and acquisition capabilities. In particular, the sub-micron focusing and positioning capabilities of the whole system enable efficient, fast and versatile sensor characterization. Extensive test have been carried out, with the aim of evaluating the sensitivity, the spatial resolution and the efficiency of APS CMOS sensors with different wavelength laser stimuli. The test system provides advanced capabilities for deep understanding of silicon particle detectors to be used in High Energy Physics experiments and/or medical imaging systems.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
