A medium to high energy x-ray diffractometer, based on commercial components, is described. The performances of such an instrument in investigating relatively thick crystalline samples are exploited. Results of test measurements, among which is the characterization of a single crystal of Ge as thick as 1 cm, are reported.
Medium and high energy x-ray instrument for sample characterization
PETRILLO, Caterina;SACCHETTI, Francesco
1996
Abstract
A medium to high energy x-ray diffractometer, based on commercial components, is described. The performances of such an instrument in investigating relatively thick crystalline samples are exploited. Results of test measurements, among which is the characterization of a single crystal of Ge as thick as 1 cm, are reported.File in questo prodotto:
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