Resistance decay has been observed in Aluminum narrow lines when the high stressing current in electromigration tests is turned off. It has been interpreted as the consequence of the relaxation of eleetromigration-induced mechanical strese.
Resistance decay after electromigration as the effect of mechanical stress relaxation
SCORZONI, Andrea;
1993
Abstract
Resistance decay has been observed in Aluminum narrow lines when the high stressing current in electromigration tests is turned off. It has been interpreted as the consequence of the relaxation of eleetromigration-induced mechanical strese.File in questo prodotto:
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