In this work we address the effects of bulk and surface damages on detectors fabricated by Hamamatsu on standard float zone (FZ) p-type material with an active thickness of 290 µm or thinned to 240 µm. In order to disentangle the effects of the two main radiation damage mechanisms, ionization effects and atomic displacement, the structures underwent two types of radiation: X-ray with doses from 0.05 to 70 Mrad (SiO2) and neutron in the range of 1−10 × 1014 neq/cm21MeV equivalent. The combined surface and bulk damage could be investigated in structures that underwent both types of irradiation. A wide set of measurements has been carried out on the test structures for a complete characterization.

Measurements of surface and bulk radiation damage effects in silicon detectors for Phase-2 CMS Outer Tracker

Mariani V.;Moscatelli F.;Passeri D.
Methodology
;
2020

Abstract

In this work we address the effects of bulk and surface damages on detectors fabricated by Hamamatsu on standard float zone (FZ) p-type material with an active thickness of 290 µm or thinned to 240 µm. In order to disentangle the effects of the two main radiation damage mechanisms, ionization effects and atomic displacement, the structures underwent two types of radiation: X-ray with doses from 0.05 to 70 Mrad (SiO2) and neutron in the range of 1−10 × 1014 neq/cm21MeV equivalent. The combined surface and bulk damage could be investigated in structures that underwent both types of irradiation. A wide set of measurements has been carried out on the test structures for a complete characterization.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11391/1481382
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