The double photoionization of N2O molecules, in the 30–50 eV energy range, has been studied by synchrotron radiation. In the whole energy range, dissociative ionization producing N+ + NO+ or N2+ + O+ has been observed. These two processes appear to occur also below the vertical thresh-old of 35.8 eV, where the double ionization should be indirect. In the range between 35.8 and 38.5 eV. The two processes occur instead by direct coulomb explosion of the N2O2+ dication. Above 38.5 eV, the dissociation leading to NO+ + N+ is also promoted by the formation of a dication metastable state, which decays by fluorescence to the ground state and then dissociates.
Determination of Structural Parameters from Advanced Molecular Electronic Spectroscopy: the Double Ionization of Nitrous Oxide by Synchrotron Radiation
PIRANI, Fernando;CANDORI, Pietro;FALCINELLI, Stefano;VECCHIOCATTIVI, Franco
2008
Abstract
The double photoionization of N2O molecules, in the 30–50 eV energy range, has been studied by synchrotron radiation. In the whole energy range, dissociative ionization producing N+ + NO+ or N2+ + O+ has been observed. These two processes appear to occur also below the vertical thresh-old of 35.8 eV, where the double ionization should be indirect. In the range between 35.8 and 38.5 eV. The two processes occur instead by direct coulomb explosion of the N2O2+ dication. Above 38.5 eV, the dissociation leading to NO+ + N+ is also promoted by the formation of a dication metastable state, which decays by fluorescence to the ground state and then dissociates.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
