IRIS - Res&Arch Institutional Research Information System - Research & Archive

SCORZONI, Andrea
 Distribuzione geografica
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Continente #
NA - Nord America 4.704
EU - Europa 3.780
AS - Asia 806
SA - Sud America 16
Continente sconosciuto - Info sul continente non disponibili 7
AF - Africa 4
Totale 9.317
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Nazione #
US - Stati Uniti d'America 4.563
UA - Ucraina 1.103
IE - Irlanda 836
IT - Italia 422
DE - Germania 358
HK - Hong Kong 320
SE - Svezia 314
VN - Vietnam 242
FI - Finlandia 232
RU - Federazione Russa 208
CA - Canada 141
GB - Regno Unito 132
JP - Giappone 70
CN - Cina 67
FR - Francia 55
TR - Turchia 49
AT - Austria 29
CH - Svizzera 28
UZ - Uzbekistan 19
PL - Polonia 15
BR - Brasile 13
KR - Corea 13
BE - Belgio 12
GR - Grecia 12
NL - Olanda 11
IN - India 9
LB - Libano 7
CZ - Repubblica Ceca 6
EU - Europa 6
AR - Argentina 3
BG - Bulgaria 2
EG - Egitto 2
ES - Italia 2
IR - Iran 2
MY - Malesia 2
NO - Norvegia 2
SG - Singapore 2
A2 - ???statistics.table.value.countryCode.A2??? 1
CI - Costa d'Avorio 1
ID - Indonesia 1
PH - Filippine 1
SA - Arabia Saudita 1
SK - Slovacchia (Repubblica Slovacca) 1
TW - Taiwan 1
ZA - Sudafrica 1
Totale 9.317
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Città #
Chandler 930
Dublin 833
Jacksonville 548
San Mateo 531
Hong Kong 318
Dong Ket 240
Medford 226
Princeton 224
Altamura 217
Wilmington 196
Lawrence 184
Montréal 140
Des Moines 135
Munich 116
Andover 113
Ann Arbor 108
Mcallen 96
Saint Petersburg 75
Boardman 64
Ashburn 63
Falls Church 63
Norwalk 54
Perugia 52
Beijing 51
Izmir 48
Kobe 38
San Paolo di Civitate 33
Tokyo 29
Helsinki 28
New York 24
Los Angeles 22
Moscow 17
Foligno 15
Woodbridge 14
Brussels 12
Governador Valadares 10
Den Haag 9
Florence 9
Sigillo 8
Trento 8
Frankfurt Am Main 7
Lausanne 6
San Diego 6
Houston 5
Richardson 5
Rome 5
Edinburgh 4
Fremont 4
Gessate 4
Nanning 4
Redmond 4
Tappahannock 4
Auburn Hills 3
Bologna 3
Buenos Aires 3
Hillsboro 3
Iksan 3
London 3
Milan 3
Mumbai 3
Redwood City 3
Schwielowsee 3
Seoul 3
Shanghai 3
Vellore 3
Vienna 3
Amsterdam 2
Città Di Castello 2
Hangzhou 2
Hanoi 2
Jesi 2
Lam Tin 2
Lappeenranta 2
Lexington 2
Ludwigshafen 2
Madrid 2
Mountain View 2
Nuremberg 2
Osaka 2
Portoferraio 2
Sestola 2
Abidjan 1
Alfa 1
Anzio 1
Baltimore 1
Bengaluru 1
Berbenno di Valtellina 1
Bratislava 1
Cambridge 1
Changsha 1
Chicago 1
Ciampino 1
Corciano 1
Geneva 1
Guangzhou 1
Istanbul 1
Jakarta 1
Kiev 1
Kish 1
Krakow 1
Totale 6.050
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Nome #
A 3V Variable Gain Amplifier in Si/SiGe BiCMOS Technology for 5 GHz WLAN Applications 328
Design of Driver Amplifiers in SiGe Technology for 5 GHz WLAN Applications 238
Design and Simulation of a 64 channel, High Voltage Analog Interface for Simulation and Acquisition of Neural Signals 81
In situ and real-time electrical monitoring of pentacene field-effect transistors 80
A System for the Dynamic Control and Thermal Characterization of Ultra Low Power Gas Sensors 73
Comparison between analytical models and finite-difference simulations in transmission-line tap resistors and L-type cross-Kelvin resistors 72
Evaluation of the Thermal Resistance of Al-Cu Electromigration Test Structures 70
Silicon-on-diamond material by pulsed laser technique 69
Automated Defect Detection in Uniform and Structured Fabrics using Gabor Filters and PCA 69
Additional Microstructural Analysis on the Samples Examined in the Paper '‘Are high resolution resistometric methods really useful for the early detection of electromigration damage?' 67
A Bidirectional High-Voltage, High-Precision System for Neural Signal Stimulation and Recording 67
Design and simulation of a 64 channel, high voltage analog interface for stimulation and acquisition of neural signals 66
Analysis of CMOS Interconnections Combining LE-FDTD Method and SOC Procedure 65
Correlation between resistance behavior and mass transport in Al–Si/Ti multilayer interconnects 64
Degradation Mechanisms Induced by High Current Density in Al-gate GaAs MESFETs 63
Activation energy in the early stage of electromigration in Al-1% Si/TiN/Ti bamboo lines 63
Biased Resistor Network Model for Electromigration Failure and Related Phenomena in Metallic Lines 62
Electrical characterization of the TiN/Ti/n+/Si (and p+/Si) interfaces by means of a circular resistor test structure 62
A 3D diamond detector for particle tracking 62
Experimental Characterization of a Personal Wireless Sensor Network for the Medical X-Ray Dosimetry 61
A Configurable Architecture for the Detection of DNA Sequences based on a E2PROM device 60
Al/Ti Ohmic Contacts to P-type Ion Implanted 6H-SiC: Mono- and Two-dimensional Analysis of the TLM Data 60
Diamond detector technology: Status and perspectives 60
A novel circular structure for the extraction of the contact resistivity-application to the Pd2/Si/n+/Si, TiN/Ti/n+/Si and TiN/Ti/p+/Si interfaces 59
Current crowding and misalignment effects as sources of error in contact resistivity measurements. Part II: Experimental results and computer simulation of self-aligned test structures 59
A Single Chip 5GHz WLAN Transmitter in 0.35 micron Si/SiGe BiCMOS Technology 58
Accurate Analytical Thermal Model of the Heating Element in Micromachined Gas Sensors 58
A Percolative Approach to Electromigration Modelling 58
Thermal Transient Measurements of an Ultra Low Power Mox Sensor 57
Accurate Analog Temperature Control of a Thin Film Microheater on Glass Substrate for Lab-on-Chip Applications 57
A Comparison Between Normally and Highly Accelerated Electromigration Tests 56
Are High Resolution Resistometric Methods Really Useful for the Early Detection of Electromigration Damage? 56
Accurate extraction of the temperature of the heating element in macromachined gas sensors 54
Characterization of CMOS Spiral Inductors 54
Ohmic contact electromigration 54
Real-time wireless personal dosimeter for Interventional Radiology Procedures 54
Flexible Tag Microlab with RFID interface and gas sensing capabilities for logistics 53
The circular resistor (CR)-a novel structure for the analysis of VLSI contacts 53
Lateral Current Crowding Effects on Contact Resistance Measurements in Four Terminal Resistor Test Patterns 52
A Stochastic Approach to Failure Analysis in Electromigration Phenomena 52
Design and Implementation of a Wireless Intelligent Personal Sensor Node for the Dosimetry of Interventional Radiology Operators 52
Recent advancements in the development of radiation hardsemiconductor detectors for S-LHC 52
Ohmic Contact Resistance Evaluation in Silicon Planar Structures: Application to the CoSi/n+ Si Interface 52
An Accurate Analysis of Misalignment Effects in CKR Test Structures 52
Numerical FDTD Modeling of Silicon Integrated Spiral Inductors 51
3D Detectors on Hydrogenated Amorphous Silicon for particle tracking in high radiation environment 51
Literature Search, Design and Preliminary Simulations of an Ion Source for FAIMS Systems 50
Electromigration in thin-film interconnection lines: models, methods and results 50
Diamond detectors for high energy physics experiments 50
Diamond detector technology, status and perspectives 50
A Multi-Standard Reconfigurable Viterbi Decoder using Embedded FPGA blocks 50
A novel method of preparation of silicon-on-diamond materials 49
A multi processor control system for a gas sensing array 49
Non-Destructive Electrical Techniques as Means for Understanding the Basic Mechanisms of Electromigration 49
Interfacial properties of SiO2 grown on 4H-SiC: comparison between N2O and wet O2 oxidation ambient 48
A Low-cost Distributed Measurement System based on Gas Smart Sensors for Environmental Monitoring 48
Characterization of the thermal transients of an Ultra Low Power micromachined sensor 48
Test structures for electromigration evaluation in submicron technology 48
Electromigration and Matthiessen's rule: Experiments on non-passivated Al-1%Si films 48
Ion Implanted TiN Films Acting as Diffusion Barriers on As+ Doped Silicon Shallow Junctions 48
Thermal Modeling and Characterization of a Thin-Film Heater on Glass Substrate for Lab-on-Chip Applications 48
Characterization of wireless personal dosimeter prototype for Interventional Radiology medical operators 48
Resistance Changes due to Cu Transport and Precipitation during Electromigration in Submicrometric Al-0.5%Cu Lines 47
Measurements, FEM Simulation and Spice Modeling of a Thermal Conductivity Detector 47
A Percolative Simulation of Electromigration Phenomena 46
A Study of the Thermal Behaviour of Different Test Patterns Used in Differential High Resolution Electromigration Measurements 46
Increase in Barrier Height of Al/n-GaAs Contacts Induced by High Current 46
Annealing effects on leakage current and epilayer doping concentration of p+n junction 4H-SiC diodes after very high neutron irradiation 46
A Feasibility Study about a Custom Hardware Implementation of the FDTD algorithm 46
Laser graphitization for polarization of diamond sensors 46
ASTM Standard Structure for Electromigration Applied to Narrow Al/TiN/Ti Metal Lines: Drawbacks and New Proposal 46
Electromigration Testing of Integrated Circuit Interconnections 45
A Specimen-Current Branching Approach for FA of Long Electromigration Test Lines 45
A Viterbi Decoder Architecture for a Standard-Agile and Reprogrammable Transceiver 45
Environmental Monitoring System Compliant With the IEEE 1451 Standard and Featuring a Simplified Transducer Interface 45
Thermal Transient Measurements of an Ultra Low Power Mox Sensor 45
Leghe Metalliche Amorfe in Schemi di Metallizzazione per Dispositivi Elettronici al Silicio 45
Annealing effects on p+n junction 4H-SiC diodes after very high neutron irradiation 44
The effect of sheet resistance modifications underneath the contact on the extraction of the contact resistivity: application to the cross Kelvin resistor 44
Ion-implanted, electron-beam annealed TiN films as diffusion barriers for Al on Si shallow junctions 44
The Influence of Thermal-Mechanical Effects on Resistance Changes During and After Electromigration Experiments 44
Modeling of critical electric field within irradiated Si-microstrip detectors 44
Current Crowding in Nested and Self-Aligned Micrometric Contacts 44
Thermal Conductivity Detector for Gas Chromatography: Very Wide Gain Range Acquisition System and Experimental Measurements 44
Latest Results on Radiation Tolerance of Diamond Detectors 44
Investigation of the Role of Compositional Effects in Electromigration Damage of Metallic Interconnects 43
Experiences on Reliability Simulation in the Framework of the Prophecy Project 43
Reliability Assessment of Multi-Via Cu-Damascene Structures by Wafer-Level Isothermal Electromigration Tests 43
A Configurable Mixed-Signal Architecture for Label-Free Smart BioSensor Applications 43
FDTD Modeling of Void Defects in VLSI interconnections 43
A Multi Processor Control System For A Gas Sensing Array 43
Methods for Contact Resistance Measurements: Applications to (n+, p+)Si/Al-1%Si Ohmic Contacts 43
An improved isothermal electromigration test for Cu-damascene characterization 43
Building Blocks for a 5GHz WLAN Transmitter in 0.35um Si/SiGe BiCMOS Technology 42
A Programmable Interface Circuit for an Ultralow Power Gas Sensor 42
Thermal conductivity detector compact Spice model based on experimental measurements and 3D simulations 42
Current crowding and misalignment effects as sources of error in contact resistivity measurements. Part I: Computer simulation of conventional CER and CKR structures 42
Activation Energy of the Early Stages of Electromigration in Al-1%Si/TiN/Ti Bamboo Lines 42
New test beam results of 3D and pad detectors constructed with poly-crystalline CVD diamond 42
Early Electromigration Effects and Early Resistance Changes 41
Totale 5.672
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Categoria #
all - tutte 34.750
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 34.750
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/201957 0 0 0 0 0 0 0 0 0 0 54 3
2019/20201.094 19 18 147 3 139 0 189 19 170 121 88 181
2020/20212.032 95 241 49 199 581 51 141 12 190 36 158 279
2021/20221.775 23 336 29 42 107 40 38 586 44 50 176 304
2022/20233.191 259 598 38 241 274 389 3 135 1.089 17 103 45
2023/2024807 85 138 49 25 22 42 155 31 234 24 2 0
Totale 9.865