IRIS - Res&Arch Institutional Research Information System - Research & Archive

SCORZONI, Andrea
 Distribuzione geografica
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Continente #
NA - Nord America 5.481
EU - Europa 4.314
AS - Asia 1.742
SA - Sud America 290
AF - Africa 18
Continente sconosciuto - Info sul continente non disponibili 8
OC - Oceania 1
Totale 11.854
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Nazione #
US - Stati Uniti d'America 5.322
UA - Ucraina 1.106
IE - Irlanda 839
SG - Singapore 733
RU - Federazione Russa 544
IT - Italia 458
DE - Germania 390
HK - Hong Kong 354
SE - Svezia 315
BR - Brasile 267
FI - Finlandia 255
VN - Vietnam 243
CA - Canada 147
GB - Regno Unito 133
CN - Cina 126
FR - Francia 117
JP - Giappone 112
TR - Turchia 53
AT - Austria 40
KR - Corea 30
CH - Svizzera 28
UZ - Uzbekistan 22
NL - Olanda 18
PL - Polonia 17
CZ - Repubblica Ceca 14
BE - Belgio 13
GR - Grecia 12
IN - India 12
AR - Argentina 10
MA - Marocco 9
LB - Libano 8
EU - Europa 6
IR - Iran 6
KZ - Kazakistan 5
EC - Ecuador 4
ID - Indonesia 4
IQ - Iraq 4
JO - Giordania 4
KG - Kirghizistan 4
PA - Panama 4
PH - Filippine 4
BD - Bangladesh 3
BG - Bulgaria 3
EG - Egitto 3
ES - Italia 3
GT - Guatemala 3
MX - Messico 3
TW - Taiwan 3
VE - Venezuela 3
ZA - Sudafrica 3
AE - Emirati Arabi Uniti 2
AM - Armenia 2
DO - Repubblica Dominicana 2
MY - Malesia 2
NO - Norvegia 2
PE - Perù 2
PT - Portogallo 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
AU - Australia 1
BO - Bolivia 1
CI - Costa d'Avorio 1
CO - Colombia 1
DZ - Algeria 1
GE - Georgia 1
KE - Kenya 1
KH - Cambogia 1
KW - Kuwait 1
LU - Lussemburgo 1
LV - Lettonia 1
OM - Oman 1
PK - Pakistan 1
PY - Paraguay 1
RO - Romania 1
SA - Arabia Saudita 1
SK - Slovacchia (Repubblica Slovacca) 1
UY - Uruguay 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 11.854
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Città #
Chandler 930
Dublin 836
Jacksonville 548
San Mateo 531
Singapore 466
Boardman 354
Hong Kong 351
Santa Clara 277
Dong Ket 240
Medford 226
Princeton 224
Altamura 217
Wilmington 196
Moscow 186
Lawrence 184
Montréal 140
Des Moines 135
Munich 124
Andover 113
Ann Arbor 108
Mcallen 96
Saint Petersburg 75
Ashburn 67
Falls Church 63
Perugia 55
Norwalk 54
Beijing 53
Helsinki 49
Izmir 48
Kobe 41
San Paolo di Civitate 33
Tokyo 30
Los Angeles 27
New York 24
Seoul 20
Foligno 15
Nuremberg 14
Woodbridge 14
Brussels 13
Shanghai 13
Rome 12
Governador Valadares 11
Rio de Janeiro 10
Trento 10
Den Haag 9
Florence 9
Milan 8
Sigillo 8
Vienna 8
Belo Horizonte 7
Brasília 7
Frankfurt Am Main 7
Porto Alegre 7
São Paulo 7
The Dalles 7
Bologna 6
Brno 6
Falkenstein 6
Lausanne 6
San Diego 6
Aioi 5
Houston 5
Richardson 5
Salvador 5
Toronto 5
Almaty 4
Bishkek 4
Buenos Aires 4
Campinas 4
Dallas 4
Edinburgh 4
Fremont 4
Gessate 4
Hangzhou 4
London 4
Mumbai 4
Nanning 4
Rabat 4
Redmond 4
Shenzhen 4
Tappahannock 4
Amman 3
Auburn Hills 3
Goiânia 3
Guatemala City 3
Hanoi 3
Hillsboro 3
Iksan 3
Madrid 3
Panama City 3
Paris 3
Redwood City 3
Schwielowsee 3
Vellore 3
Viamão 3
Agadir 2
Amsterdam 2
Anápolis 2
Baguio City 2
Bauru 2
Totale 7.488
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Nome #
A 3V Variable Gain Amplifier in Si/SiGe BiCMOS Technology for 5 GHz WLAN Applications 370
Design of Driver Amplifiers in SiGe Technology for 5 GHz WLAN Applications 258
In situ and real-time electrical monitoring of pentacene field-effect transistors 133
Design and Simulation of a 64 channel, High Voltage Analog Interface for Simulation and Acquisition of Neural Signals 93
A System for the Dynamic Control and Thermal Characterization of Ultra Low Power Gas Sensors 89
A Bidirectional High-Voltage, High-Precision System for Neural Signal Stimulation and Recording 88
A 3D diamond detector for particle tracking 85
Evaluation of the Thermal Resistance of Al-Cu Electromigration Test Structures 84
Silicon-on-diamond material by pulsed laser technique 83
Comparison between analytical models and finite-difference simulations in transmission-line tap resistors and L-type cross-Kelvin resistors 83
Automated Defect Detection in Uniform and Structured Fabrics using Gabor Filters and PCA 81
Additional Microstructural Analysis on the Samples Examined in the Paper '‘Are high resolution resistometric methods really useful for the early detection of electromigration damage?' 79
Characterization of CMOS Spiral Inductors 79
Design and simulation of a 64 channel, high voltage analog interface for stimulation and acquisition of neural signals 79
A Single Chip 5GHz WLAN Transmitter in 0.35 micron Si/SiGe BiCMOS Technology 77
Biased Resistor Network Model for Electromigration Failure and Related Phenomena in Metallic Lines 77
Analysis of CMOS Interconnections Combining LE-FDTD Method and SOC Procedure 76
A Configurable Architecture for the Detection of DNA Sequences based on a E2PROM device 75
Degradation Mechanisms Induced by High Current Density in Al-gate GaAs MESFETs 74
Thermal Transient Measurements of an Ultra Low Power Mox Sensor 72
Literature Search, Design and Preliminary Simulations of an Ion Source for FAIMS Systems 72
Ion Implanted TiN Films Acting as Diffusion Barriers on As+ Doped Silicon Shallow Junctions 72
Diamond detectors for high energy physics experiments 72
Correlation between resistance behavior and mass transport in Al–Si/Ti multilayer interconnects 71
Real-time wireless personal dosimeter for Interventional Radiology Procedures 71
Lateral Current Crowding Effects on Contact Resistance Measurements in Four Terminal Resistor Test Patterns 70
Diamond detector technology: Status and perspectives 70
Al/Ti Ohmic Contacts to P-type Ion Implanted 6H-SiC: Mono- and Two-dimensional Analysis of the TLM Data 69
Design and Implementation of a Wireless Intelligent Personal Sensor Node for the Dosimetry of Interventional Radiology Operators 69
Activation energy in the early stage of electromigration in Al-1% Si/TiN/Ti bamboo lines 69
A Percolative Approach to Electromigration Modelling 69
Experimental Characterization of a Personal Wireless Sensor Network for the Medical X-Ray Dosimetry 69
3D Detectors on Hydrogenated Amorphous Silicon for particle tracking in high radiation environment 68
A novel method of preparation of silicon-on-diamond materials 67
Electrical characterization of the TiN/Ti/n+/Si (and p+/Si) interfaces by means of a circular resistor test structure 67
A novel circular structure for the extraction of the contact resistivity-application to the Pd2/Si/n+/Si, TiN/Ti/n+/Si and TiN/Ti/p+/Si interfaces 67
Measurements, FEM Simulation and Spice Modeling of a Thermal Conductivity Detector 67
A Comparison Between Normally and Highly Accelerated Electromigration Tests 66
A multi processor control system for a gas sensing array 66
The circular resistor (CR)-a novel structure for the analysis of VLSI contacts 66
Accurate Analog Temperature Control of a Thin Film Microheater on Glass Substrate for Lab-on-Chip Applications 66
A study of the radiation tolerance of poly-crystalline and single-crystalline CVD diamond to 800 MeV and 24 GeV protons 66
Are High Resolution Resistometric Methods Really Useful for the Early Detection of Electromigration Damage? 65
Accurate Analytical Thermal Model of the Heating Element in Micromachined Gas Sensors 65
Thermal Modeling and Characterization of a Thin-Film Heater on Glass Substrate for Lab-on-Chip Applications 65
Flexible Tag Microlab with RFID interface and gas sensing capabilities for logistics 64
A Low-cost Distributed Measurement System based on Gas Smart Sensors for Environmental Monitoring 64
Laser graphitization for polarization of diamond sensors 64
Electromigration and Matthiessen's rule: Experiments on non-passivated Al-1%Si films 64
Current crowding and misalignment effects as sources of error in contact resistivity measurements. Part II: Experimental results and computer simulation of self-aligned test structures 64
A Feasibility Study about a Custom Hardware Implementation of the FDTD algorithm 63
Numerical FDTD Modeling of Silicon Integrated Spiral Inductors 63
Accurate extraction of the temperature of the heating element in macromachined gas sensors 62
Ohmic contact electromigration 62
A Multi-Standard Reconfigurable Viterbi Decoder using Embedded FPGA blocks 62
Annealing effects on p+n junction 4H-SiC diodes after very high neutron irradiation 61
Characterization of wireless personal dosimeter prototype for Interventional Radiology medical operators 61
Diamond detector technology, status and perspectives 61
Feasibility study on the use of CMOS sensors as detectors in radioguided surgery with β−- emitters 61
Environmental Monitoring System Compliant With the IEEE 1451 Standard and Featuring a Simplified Transducer Interface 60
Characterization of the thermal transients of an Ultra Low Power micromachined sensor 60
Recent advancements in the development of radiation hardsemiconductor detectors for S-LHC 60
A Study of the Thermal Behaviour of Different Test Patterns Used in Differential High Resolution Electromigration Measurements 59
Interfacial properties of SiO2 grown on 4H-SiC: comparison between N2O and wet O2 oxidation ambient 59
A Standard Cell Hardware Implementation for Finite-Difference Time Domain (FDTD) Calculation 59
A Configurable Mixed-Signal Architecture for Label-Free Smart BioSensor Applications 59
Non-Destructive Electrical Techniques as Means for Understanding the Basic Mechanisms of Electromigration 59
An Accurate Analysis of Misalignment Effects in CKR Test Structures 59
Latest Results on Radiation Tolerance of Diamond Detectors 59
A Stochastic Approach to Failure Analysis in Electromigration Phenomena 58
Ohmic Contact Resistance Evaluation in Silicon Planar Structures: Application to the CoSi/n+ Si Interface 58
A SystemVerilog-UVM Methodology for the Design, Simulation and Verification of Complex Readout Chips in High Energy Physics Applications 58
A Multi Processor Control System For A Gas Sensing Array 57
Thermal Transient Measurements of an Ultra Low Power Mox Sensor 57
The effect of sheet resistance modifications underneath the contact on the extraction of the contact resistivity: application to the cross Kelvin resistor 57
Increase in Barrier Height of Al/n-GaAs Contacts Induced by High Current 56
Test structures for electromigration evaluation in submicron technology 56
Electromigration in thin-film interconnection lines: models, methods and results 56
Reliability Assessment of Multi-Via Cu-Damascene Structures by Wafer-Level Isothermal Electromigration Tests 55
A Viterbi Decoder Architecture for a Standard-Agile and Reprogrammable Transceiver 55
Annealing effects on leakage current and epilayer doping concentration of p+n junction 4H-SiC diodes after very high neutron irradiation 55
A Programmable Interface Circuit for an Ultralow Power Gas Sensor 55
ASTM Standard Structure for Electromigration Applied to Narrow Al/TiN/Ti Metal Lines: Drawbacks and New Proposal 55
New test beam results of 3D and pad detectors constructed with poly-crystalline CVD diamond 55
Resistance Changes due to Cu Transport and Precipitation during Electromigration in Submicrometric Al-0.5%Cu Lines 54
Metal/Semiconductor Contact Resistivity and its Determination from Contact Resistance Measurements 54
A Specimen-Current Branching Approach for FA of Long Electromigration Test Lines 54
Building Blocks for a 5GHz WLAN Transmitter in 0.35um Si/SiGe BiCMOS Technology 54
Ion-implanted, electron-beam annealed TiN films as diffusion barriers for Al on Si shallow junctions 54
Modeling of critical electric field within irradiated Si-microstrip detectors 54
Performance of CMOS imager as sensing element for a Real-time Active Pixel Dosimeter for Interventional Radiology procedures 54
Monitoring Soil and Ambient Parameters in the IoT Precision Agriculture Scenario: An Original Modeling Approach Dedicated to Low-Cost Soil Water Content Sensors 54
A Percolative Simulation of Electromigration Phenomena 53
An improved isothermal electromigration test for Cu-damascene characterization 53
Investigation of the Role of Compositional Effects in Electromigration Damage of Metallic Interconnects 52
Experiences on Reliability Simulation in the Framework of the Prophecy Project 52
Electromigration Testing of Integrated Circuit Interconnections 52
FDTD Modeling of Void Defects in VLSI interconnections 52
Thermal conductivity detector compact Spice model based on experimental measurements and 3D simulations 52
Current crowding and misalignment effects as sources of error in contact resistivity measurements. Part I: Computer simulation of conventional CER and CKR structures 52
Totale 7.001
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Categoria #
all - tutte 56.456
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 56.456
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020269 0 0 0 0 0 0 0 0 0 0 88 181
2020/20212.032 95 241 49 199 581 51 141 12 190 36 158 279
2021/20221.775 23 336 29 42 107 40 38 586 44 50 176 304
2022/20233.191 259 598 38 241 274 389 3 135 1.089 17 103 45
2023/20241.166 85 138 49 25 22 42 155 31 234 24 153 208
2024/20252.194 68 308 291 61 341 83 70 186 609 163 14 0
Totale 12.418